MIL-PRF-19500/279E
4.6.3 Hermetic seal test. All devices will be gross leak tested in accordance with method 1071 of MIL-STD-750,
condition D or E. If condition E is chosen for non-transparent devices after alcohol rinse, the devices shall be dried
and placed on a clean, white blotter and observed for any evidence of dye.
* 4.6.4 Pre burn-in tests. The parameters VF and IR shall be measured and the data recorded for all devices in the
lot. All devices shall be handled or identified such that the delta end-points can be determined after the burn-in test.
All devices which fail to meet these requirements shall be removed from the lot and the quantity removed shall be
noted on the lot history.
4.6.5 Burn-in test. Power burn-in conditions are as follows: Method 1038 of MIL-STD-750, condition B for 164
hours (minimum) under the following conditions:
a. TA = 25C, VRWM = full rated (see 1.2).
b. IO = 100 mA dc, f = 60 Hz.
* 4.6.6 Post burn-in tests. The parameters VF and IR shall be retested (within 24 hours) after burn-in and the data
recorded for all devices in the lot. The parameters measured shall not have changed during the burn-in test from the
initial value by more than the specifed amount as follows:
a. VF = 10 percent maximum.
b. IR = +250 nanoamperes or 100 percent maximum.
* 4.6.7 Burn-in test failure (screening). All devices that exceed the delta limits of 4.6.6 or the limits of those tests
performed, shall be removed from the inspection lot and the quantity removed shall be noted on the lot history.
Where the quantity removed after burn-in exceeds 10 percent of the total inspection lot on burn-in test, the entire lot
shall be unacceptable as JANTX types.
6
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business