MIL-PRF-19500/187B
3.7 Marking. Marking shall be in accordance with MIL-PRF-19500.
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* 3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
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4. VERIFICATION
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4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Conformance inspection (see 4.3 and table I).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
* 4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not request the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
* 4.3 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.3.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein.
* 4.3.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table VIb (JAN) of MIL-PRF-19500. Electrical measurements (end-points) shall be in accordance
with table I, subgroup 2 herein.
Subgroup
Method
Condition
IO = 50 mA dc, VR = 1,400 V dc, TA = +125°C min. 1 surge = 10 A dc, 5 surges of
B2
4066
1/120 sec each.
VR = 1,400 V dc, IO = 50 mA dc, TA = +125°C min. f = 60 Hz
B3
1026
* 4.3.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
Subgroup
Method
Condition
C2
2036
Condition E, weight = 1 lb; condition A, weight = 2 lb, duration = 30 sec.
VR = 1,400 V dc, IO = 50 mA dc, TA = +125°C min. f = 60 Hz.
C6
1026
* 4.3.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
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