MIL-PRF-19500/198E
4.3.2.1 Group B inspection, table VIb (JAN) of MIL-PRF-19500.
Subgroup
Method
Condition
Operational life, see 4.6, test circuit on figure 6, TA = +100°C.
B3
1040
TA = +150°C.
B6
1031
4.3.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
Subgroup
Method
Condition
C2
2036
Lead fatigue.
TA = +150°C.
C6
1031
4.4 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.4.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5 Holding current. The holding current is measured by decreasing the anode current to the point where the
device under test switches from the on-state to the off-state. The gate current shall be -150 μA and the anode supply
voltage shall be 5 volts. The test circuit shown on figure 5, or its equivalent, may be used. Resistor R4 is increased,
thereby decreasing device anode current, until the device switches to the off-state. The current measured by M1
immediately prior to switching is the holding current. Switch S1 is used to trigger the device to the on-state prior to
making a holding current measurement.
4.6 Operational life test. The operational life test shall be performed in the test circuit shown on figure 6, or its
equivalent. Transformer T1 is adjusted such that the peak value of secondary voltage from T3 equals the rated
forward blocking voltage of the device under test. Transformer T2 is adjusted such that meter reads 220 mA average
rectified current. Transformer T5 is selected to provide a maximum secondary peak voltage of 5 volts as read on
meter M3. The device under test shall be in an oven at an ambient temperature of +100° ±5°C.
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