MIL-PRF-19500-262 Semiconductor Device, Transistor, Npn, Silicon, High-Power Types 2N1722 And 2N1724, Jan And JantxThis specification covers the performance requirements for NPN, silicon, power transistors for use in high-speed power-switching applications. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/262G

4.3 Screening. Screening shall be in accordance with table E-IV of MIL-PRF-19500 and as specified herein. The

following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I

herein shall not be acceptable.

Screen (see

Measurement

table IV of

JANTX level

Required, TA = +200�C

(1) 3c

Thermal impedance, method 3131 of

IEBO, ICES, and hFE1

ĆIEBO = 100 percent of initial value or

100 �A dc, whichever is greater.

ĆICES = 100 percent of initial value or

100 �A dc, whichever is greater.

ĆhFE1 = �15 percent of initial value.

See 4.3.1; 168 hours minimum

Subgroup 2 of table I herein;

IEBO, ICES, and hFE1

ĆIEBO = 100 percent of initial value or

100 �A dc, whichever is greater.

ĆICES = 100 percent of initial value or

100 �A dc, whichever is greater.

ĆhFE1 = �15 percent of initial value.

4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: VCE = 10-30 V dc; power shall be

applied to achieve TJ = +175�C minimum using a minimum power dissipation = 75 percent of maximum rated PT

(see 1.3). NOTE: No heat sink or forced air cooling on the devices shall be permitted.

4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with

method 3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW, (and VH where

appropriate). Measurement delay time (tMD) = 70 �s max. See table II, subgroup 4 herein.

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as

specified herein.

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I

herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for

subgroup testing in table E-VIB (JAN and JANTX) of MIL-PRF-19500 and herein. Electrical measurements (end-

points) shall be in accordance with table I, subgroup 2 herein. Delta measurements shall be in accordance with the

applicable steps of 4.5.3 herein.