MIL-PRF-19500/508D
TABLE I. Group A inspection.
MIL-STD-750
Limits
Inspection 1/
Symbol
Unit
Method
Conditions
Min
Max
Subgroup 1
2071
Visual and mechanical
examination
Subgroup 2
3011
Collector to emitter breakdown
Bias condition D, IC = 50 mA dc,
V(BR)CEO
voltage
pulsed (see 4.5.1)
100
V dc
2N6437
2N6348
120
V dc
µA dc
Collector to emitter cutoff current
3041
Bias condition D
50
ICEO
VCE = 50 V dc
2N6437
2N6438
VCE = 60 V dc
µA dc
Emitter to base cutoff current
3061
100
Bias condition D, VEB = 6 V dc
IEBO
µA dc
Collector to emitter cutoff current
3041
5.0
Bias condition A, VBE = 1.5 V dc,
ICEX1
2N6437
VCE = 100 V dc
2N6438
VCE = 120 V dc
µA dc
Collector to base cutoff current
3036
Bias condition D
10
ICBO
VCB = 120 V dc
2N6437
2N6438
VCB = 140 V dc
Base emitter voltage (saturated)
3066
1.8
V dc
Test condition A, IC = 10 A dc,
VBE(sat)
IB = 1.0 A dc, pulsed (see 4.5.1)
Collector to emitter saturated
3071
1.0
V dc
IC = 10 A dc, IB = 1.0 A dc, pulsed
VCE(sat)1
voltage
(see 4.5.1)
Collector to emitter
3071
1.8
V dc
IC = 25 A dc, IB = 2.5 A dc, pulsed
VCE(sat)2
saturated voltage
(see 4.5.1)
3076
Forward-current
40
VCE = 2 V dc, IC = .5 A dc, pulsed
hFE1
transfer ratio
(see 4.5.1)
See footnote at end of table.
7
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