MIL-PRF-19500/582B
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 4
IC = 0.2 A dc, VCE = 1.5 V dc,
Small signal short circuit
40
3206
hfe
forward current transfer
f = 1.0 kHz
ratio
IC = 0.1 A dc, VCE = 10 V dc,
Magnitude of small-
3
3306
|hFE |
signal short-circuit
f = 10 MHz
forward-current transfer
ratio
IE = 0, VCB = 20 V dc,
50
pF
Open circuit output
Cobo
3236
capacitance
f = 1 MHz
Subgroup 5
TC = +25C; t 0.5 s, 1 cycle.
Safe operating area
3051
(continuous dc)
IC = 1.0 A dc, VCE = 2 V dc,
Test 1
IC = 1.0 A dc, VCE = 10 V dc,
Test 2
IC = 50 mA dc, VCE = 90 V dc,
Test 3
Electrical
See table I, subgroup 2
measurements
Subgroups 6 and 7
Not applicable
1/
For sampling plan, see MIL-PRF-19500.
2/
For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests.
3/
Separate samples may be used.
4/
Not required for laser marked devices.
5/
This test required for the following end-point measurements only:
Group B, step 1 of 4.4.2 herein (JAN, JANTX, and JANTXV).
Group C, subgroup 2.
Group E, subgroup 1 and 2.
11
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business