MIL-PRF-19500/582B
* TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 1 2/
2071
Visual and mechanical
n = 45 devices, c = 0
examination 3/
Solderability 3/
2026
n = 15 leads, c = 0
Resistance to 3/ 4/
1022
n = 15 devices, c = 0
solvent
Temp cycling 3/
1051
Test condition C, 25 cycles.
n = 22 devices, c = 0
Hermetic seal
1071
n = 22 devices, c = 0
Fine leak
Gross leak
Electrical measurements
Table I, subgroup 2
Precondition TA = +250C at t = 24
2037
Bond strength 3/
hrs or TA = +300C at t = 2 hrs, n =
11 wires, c = 0
Subgroup 2
* Thermal impedance 5/
3131
See 4.3.2
°C/W
ZθJC
Breakdown voltage collector
3011
Bias condition D, pulsed (see 4.5.1),
V(BR)CEO
V dc
to emitter
IC = 10 mA dc
2N5679
100
2N5680
120
A dc
10
ICEO
3041
Bias condition D
Collector emitter cutoff
current
VCE = 70 V dc
2N5679
VCE = 80 V dc
2N5680
Collector emitter cutoff
100
nA dc
ICEX1
3041
Bias condition A, VBE = 1.5 V dc
current
VCE = 100 V dc
2N5679
2N5680
VCE = 120 V dc
100
nA dc
ICBO
Bias condition D
3036
Collector to base cutoff
current
VCE = 100 V dc
2N5679
VCE = 120 V dc
2N5680
A dc
1.0
3061
Bias condition D, VBE = 4.0 V dc
IEBO
Emitter to base cutoff
current
See footnotes at end of table.
9
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