MIL-PRF-19500/582B
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein. Alternate flow is allowed for quality conformance inspection in accordance with MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table I herein. End-point
electrical measurements shall be in accordance with table I, subgroup 2 herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified.
Separate samples may be used for each step. In the event of a group B failure, the manufacturer may pull a new
sample at double the sample size from either the failed assembly lot or from another assembly lot from the same
wafer lot. If the new "assembly lot" option is exercised, the failed assembly lot shall be scrapped. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2 herein. Delta measurements shall be in
accordance with table II herein.
Method
Condition
Step
Steady-state life: 340 hours, VCB 20 V dc, TJ = 150C minimum.
1
1027
External heating of the device under test to achieve TJ = 150C minimum
is allowed provided that a minimum of 75 percent of rated power is
dissipated. No heat sink or forced-air cooling on the devices shall be
permitted. n = 45 devices, c = 0.
*
2
1026
The steady-state life test of step 1 shall be extended to 1,000 hours for
each die design. Samples shall be selected from a wafer lot every twelve
months of wafer production, however, step 2 shall not be required more
than once for any single wafer lot. n = 45, c = 0.
High-temperature life (non-operating), TA = +200C. n = 22, c = 0.
3
1032
4.4.2.1 Group B sample selection. Samples selected for group B inspection shall meet all of the following
requirements:
a.
For JAN, JANTX, and JANTXV samples shall be selected randomly from a minimum of three wafers
(or from each wafer in the lot) from each wafer lot.
b.
Shall be chosen from an inspection lot that has been submitted to and passed group A, subgroup 2,
conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high
temperature, the samples for life test (group B for JAN, JANTX, and JANTXV) may be pulled prior to
the application of final lead finish.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500. Electrical measurements (end-points) shall be in accordance with
table I, subgroup 2 herein. Delta measurements shall be in accordance with table II herein.
* 4.4.3.1 Group C inspection, table E-VII (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
C2
2036
Test condition E.
See 4.3.2, RJC = 17.5C/W.
*
C5
3131
C6
Not applicable.
4.4.3.2 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any lot
containing the intended package type and lead finish procured to the same specification which is submitted to and
passes group A tests for conformance inspection. Testing of a subgroup using a single device type enclosed in the
intended package type shall be considered as complying with the requirements for that subgroup.
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