MIL-PRF-19500/588A
4.3 Screening (JANS, JANTX and JANTXV levels only). Screening shall be in accordance with MIL-PRF-19500 (Appendix E, table
IV), and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits
of table I herein shall not be acceptable.
Screen (see
appendix E,
Measurement
table IV of
MIL-PRF-19500)
JANS level
JANTX and JANTXV levels
1/
Gate stress test (see 4.5.3)
Gate stress test (see 4.5.3)
1/
Clamped IL test (see 4.5.5)
Clamped IL test (see 4.5.5)
1/
Thermal response (see 4.5.4)
Thermal response (see 4.5.4)
9 1/
Group A, subgroup 2 herein
Group A, subgroup 2 herein
10
MIL-STD-750, method 1042, test condition B
MIL-STD-750, method 1042, test condition B
11
IGESF1, IGESR1, ICES1, VCE(on), VGE(th)
IGESF1, IGESR1, ICES1, VCE(on), VGE(th)
Subgroup 2 of table I herein.
IGES = 50 nA or 100 percent of initial value,
whichever is greater.
ICES = 250 A or 100 percent of initial value,
whichever is greater.
Subgroup 2 of table I herein.
MIL-STD-750, method 1042, test condition A,
12 2/
MIL-STD-750, method 1042, test condition A,
TA = +125 C minimum
TA = +125 C minimum
Subgroup 2 of table I herein.
13
Subgroups 2 and 3 of table I herein.
IGES = 50 nA or 100 percent of initial value,
IGES = 50 nA or 100 percent of initial value,
whichever is greater.
whichever is greater.
ICES = 250 A or 100 percent of initial value,
ICES = 250 A or 100 percent of initial value,
whichever is greater.
whichever is greater.
VCE(ON) =
20 percent of initial value.
VCE(ON) =
20 percent of initial value.
VGE(th) =
20 percent of initial value.
VGE(th) =
20 percent of initial value.
1/ Shall be performed anytime before screen 10.
2/ No heat sinking of devices is allowed.
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