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MIL-PRF-19500-588 Semiconductor Device ,Transistor, Insulated Gate, Bipolar, N-Channel, Silicon Type 2N7364 Jan, Jantx, Jantxv And JansThis specification covers the performance requirements for insulated gate, bipolar power transistors.

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MIL-PRF-19500/588A
4.5.2 Thermal resistance. Thermal resistance measurements shall be performed in accordance with method 3103 of MIL-STD-750.
The maximum limit of R JC (max) shall be 0.83 C/W. The following parameter measurements shall apply:
a. Measuring current (IM): ...................................................... 10 mA.
b. Collector heating current (IH):............................................. 4 A minimum.
c. Heating time (tH):................................................................ Steady state (see MIL-STD-750, method 3103, for definition).
d. Collector-emitter heating voltage (VH): ............................... 25 V minimum.
e. Measurement time delay (tMD): .......................................... 30 to 60 s.
Sample window time (tSW): ................................................ 10 s maximum.
f.
4.5.3 Gate stress test.
VGE = 30 V minimum.
t = 250 s minimum.
4.5.4 Thermal response (measurement). The VGE measurements shall be performed in accordance with method 3103 of
MIL-STD-750. The VGE conditions (IH and VH) and maximum limit shall be derived by each vendor from the thermal response curves
(see figure 2). The VGE measurement and conditions for each device in the qualification lot shall be considered final after the
manufacturer has had the opportunity to test five consecutive lots. The following parameter measurements shall apply:
a.
Measuring current (IM): .............................................. 10 mA.
Collector heating current (IH):..................................... 4 A minimum.
b.
Heating time (tH):........................................................ 75 ms minimum.
c.
Collector-emitter heating voltage (VH): ....................... 25 V minimum.
d.
Measurement time delay (tMD): .................................. 30 to 60 s.
e.
Sample window time (tSW): ........................................ 10 s maximum.
f.
4.5.5 Clamped inductive load. This test shall be performed in accordance with method 3490 of MIL-STD-750.
VCC = 50 V minimum.
a.
VG = 20 V.
b.
c.
L = 10 H minimum.
d.
RG = 2 ohm.
VCL = 80 percent VBR(CE) maximum.
e.
IL = 220 A minimum.
f.
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