MIL-PRF-19500/621D
TABLE I. Group A inspection.
MIL-STD-750
Limits
Inspection 1/
Symbol
Unit
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
examination
Subgroup 2
°C/W
ZθJC
Thermal impedance
3131
See 4.3.2
Collector - emitter
3011
Bias condition D;
VCEO(sus)
-80
V dc
breakdown voltage
IC = -0.2 A dc; pulsed (see. 4.5.1)
Emitter base cutoff
3061
Bias condition D; VEB = -7 V dc
IEBO
-5.0
mA dc
current
µA dc
Collector - emitter
3041
Bias condition A; VBE = -1.5 V dc;
ICEX1
-20
cutoff current
VCE = -80 V dc
µA dc
Collector - emitter
3041
Bias condition C; VCE = -70 V dc
ICES1
-20
cutoff current
Base - emitter
3066
Test condition A; IC = -5 A dc;
VBE(sat)1
-1.5
V dc
saturated voltage
IB = -0.5 A dc; Pulsed (see 4.5.1)
Collector - emitter
3071
IC = -5 A dc; IB = -0.5 A dc;
VCE(sat)1
-1.0
V dc
saturated voltage
pulsed (see 4.5.1)
Forward - current
3076
VCE = -2.0 V dc; IC = -1.0 A dc;
hFE1
50
175
transfer ratio
pulsed (see 4.5.1)
Forward - current
3076
VCE = -2.0 V dc; IC = -3.0 A dc;
hFE2
30
140
transfer ratio
pulsed (see 4.5.1)
Subgroup 3
TA = +150°C
High-temperature
operation:
Collector to emitter
3041
Bias condition C; VCE = -70 V dc
ICES2
-5.0
mA dc
cutoff current
TA = -55°C
Low-temperature
operation:
Forward-current
3076
VCE = -2.0 V dc; IC = -3.0 A dc;
hFE3
12
transfer ratio
pulsed (see 4.5.1)
See footnote at end of table.
7
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