MIL-PRF-19500/626A
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for subgroup testing in
appendix E, table IX of MIL-PRF-19500. Electrical measurements (end-points) and delta requirements shall be in accordance with the
applicable steps and footnotes of table I, group A, subgroup 2 herein and 4.4.5.
4.4.4.1 Group E inspection, appendix E, table IX of MIL-PRF-19500.
Subgroup
Method
Condition
Sampling plan
1
1051
500 cycles.
22 devices, c = 0
2
1038
Condition A, t = 1,000 hours
22 devices, c = 0
VR = 80 percent Vrated
3
Not applicable
TA = +25°C; RθJL (or RθJE)
4
3101
5 devices, c = 0
= rated RθJL (or RθJE) (see 1.3).
5
1016
VR = rated VR (see 1.3);
5 devices, c = 0
pressure = 33 mmHg; t = 1 minute
(minimum), RISO = 2.0 x 106 Ω maximum.
4.4.5 Group B, C, and E electrical measurements (delta requirements).
Test
Method
Condition
Symbol
Maximum
Unit
VF
4011
IF = 5 A (pk);
VF1
0.78
V dc
pulsed (see 4.5.1)
ĆVF1
± 100
ĆVF
4011
mV dc
µA dc
IR
4016
DC method, VR = rated
IR1
50
VR (see 1.3); pulsed (see 4.5.1)
ĆIR
ĆIR1
± 5 or 100 percent
µA dc
4016
whichever is greater.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in 4.3.2.1 of MIL-STD-750.
4.5.2 Thermal impedance ZθJX measurements for screening. The Z
θJX measurements shall be performed in accordance with MIL-
STD-750, method 3101. The maximum limit (not to exceed the group A, subgroup 2 limit) for ZθJX in 19500 (Appendix E, table IV of
MIL-PRF-19500) shall be derived by each vendor by means of statistical process control. When the process has exhibited control and
capability, the capability data shall be used to establish the fixed screening limit. In addition to screening, once a fixed limit has been
established, monitor all future sealing lots using a random five piece sample from each lot to be plotted on the applicable X, R chart. If a
lot exhibits an out of control condition, the entire lot shall be removed from the line and held for engineering evaluation and disposition.
4.5.2.1 Thermal impedance (ZθJX). measurements) for initial qualification or requalification. The ZθJX measurements shall be
performed in accordance with MIL-STD-750, method 3101 (read and record date ZθJX). ZθJX shall be supplied on one lot (500 pieces
minimum) and a thermal response curve shall be submitted. Twenty two of these samples shall be serialized and provided to the
qualifying activity for correlation prior to shipment of parts. Measurements conditions shall be in accordance with 4.4.1.
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