MIL-S-19500-254 Semiconductor Device, Diode, Silicon, Types 1N1147 And 1N1149, JanThis specification covers the performance requirements for silicon, semiconductor diodes for use particularly as high-voltage rectifier devices in compatible equipment circuits. One level of product assurance is provided for each device as specified in MIL-PRF-19500.

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MIL-S-19500/2548

* 3.7 Marking. Marking shall be in accordance with MIL-PRF-19500.

* 3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and shall be free from other defects that will affect life, serviceability, or appearance.

* 4. VERIFICATI0N

a. Qualification inspection (see 4.2).

b. Conformance inspection (see 4.3 and table I).

* 4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified herein.

* 4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In case qualification was awarded to a prior revision of the specification sheet that did not request the performance of table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on the first inspection lot of this revision to maintain qualification.

* 4.3 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as specified herein.

* 4.3.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I

herein.

* 4.3.2 Group 8 inspection. Group 8 inspection shall be conducted in accordance with the conditions specified for subgroup testing in table VIb (JAN) of MIL-PRF-19500. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.

Subgroup	Method	Condition
82	4066	I0 = 0, Vac = 0, TC = +100°C min. 10 surges each of 1/120 sec duration at 1 minute intervals.
83	1026	VR = 8.4 kV dc for 1N1147, VR = 11.2 kV dc for 1N1149, I0 = 45 mA dc, TC =
		+100°C min., f = 60 Hz

* 4.3.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in table VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.

Subgroup Method Condition

C2 2036 Not applicable.

C6 1026 VR = 8.4 kV dc for 1N1147, VR = 11.2 kV dc for 1N1149, I0 = 45 mA dc, TC =

+100°C min., f = 60 Hz

* 4.3.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for subgroup testing in table IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end- points) shall be in accordance with table I, subgroup 2 herein.