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MIL-PRF-19500-127 Semiconductor Devices, Diode, Silicon, Voltage Regulator, Types 1N4370A 1 Through 1N4372A-1 And 1N746A-1 Through 1N759A-1, 1N4370Aur-1 Through 1N4372Aur-1 And 1N746Aur-1 Through 1N759Aur-1, 1N4370C-1 Through 1N4372C-1 And 1N746C-1 Through 1N759C-1, 1N4370Cur-1 Through 1N4372Cur 1 And 1N746Cur-1 Through 1N759Cur-1, 1N4370D-1 Through 1N4372D-1 And 1N746D-1 Through 1N759D-...This specification covers the performance requirements for 500 milliwatt, silicon, voltage regulator diodes with voltage tolerances of 5, 2, and 1 percent. Three levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two levels of product assurance is provided for each unencapsulated device.

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MIL-PRF-19500/127W
4.3.1 Screening (JANHC and JANKC). Screening of JANHC and JANKC die shall be in accordance with
appendix G of MIL-PRF-19500.
4.3.1.1 JAN product. JAN product will have temperature cycling and thermal impedance testing performed in
accordance with MIL-PRF-19500, JANTX level screening requirements.
* 4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method
3101 or 4081 of MIL-STD-750, as applicable, using the guidelines in that method for determining IM, IH, tH, tMD (and
VC where appropriate). (See figures 9 through 11.) Measurement delay time (tMD) = 70 s max. See table II,
subgroup 4 herein. See figure 12 for mounting conditions.
4.3.3 Power burn-in conditions. Power burn-in conditions are as follows (see 4.5.5): IZ(min) = column 8 of table
IV herein. TA = 75C maximum. Test conditions in accordance with method 1038 of MIL-STD-750, condition B.
Adjust IZ or TA to achieve the required TJ. TJ = 125C minimum. With approval of the qualifying activity and
preparing activity, alternate burn-in criteria (hours, bias conditions, TJ, mounting conditions) may be used for JANTX
and JANTXV quality levels. A justification demonstrating equivalence is required. In addition, the manufacturing
site's burn-in data and performance history will be essential criteria for burn-in modification approval.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein. Group A inspection shall be performed on each sublot.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and 4.4.2.1 herein. Electrical
measurements (end-points) shall be in accordance with the applicable inspections of table I, subgroup 2 herein.
(ZJX applies to B2 and B3 only).
4.4.2.1 Group B inspection, table E-VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
0C to +100C, 10 cycles.
B2
1056
-55C to +175C, 25 cycles.
B2
1051
See 4.5.1.
B2
4066
B3
1027
IZ(min) = Column 8 of table IV minimum. Adjust IZM or TA to ensure
a TJ = 150C (minimum) (see 4.5.5).
B4
2075
As applicable.
B4
2101
Decap analysis, scribe and break only.
TA = 175C.
B6
1032
10



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