MIL-PRF-19500-127 Semiconductor Devices, Diode, Silicon, Voltage Regulator, Types 1N4370A 1 Through 1N4372A-1 And 1N746A-1 Through 1N759A-1, 1N4370Aur-1 Through 1N4372Aur-1 And 1N746Aur-1 Through 1N759Aur-1, 1N4370C-1 Through 1N4372C-1 And 1N746C-1 Through 1N759C-1, 1N4370Cur-1 Through 1N4372Cur 1 And 1N746Cur-1 Through 1N759Cur-1, 1N4370D-1 Through 1N4372D-1 And 1N746D-1 Through 1N759D-...This specification covers the performance requirements for 500 milliwatt, silicon, voltage regulator diodes with voltage tolerances of 5, 2, and 1 percent. Three levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two levels of product assurance is provided for each unencapsulated device.

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MIL-PRF-19500/127W

TABLE II. Group E inspection qualification and requalification (all product assurance levels).

Qualification,

MIL-STD-750

conformance

Inspection

inspection

Method

Conditions

(sampling plan)

Subgroup 1

45 devices, c = 0

500 cycles, -55C to +175C

Temperature cycling

1051

Hermetic seal

1071

Electrical measurements

See table I, subgroup 2 and table III, step 1

22 devices, c = 0

Subgroup 2

Intermittent operation life

1037

6,000 cycles. IZ = column 8 of table IV

Electrical measurements

See table I, subgroup 2 and table III, step 1.

Provide read and record ZJX data to the

qualifying activity.

N/A

Subgroup 4

Thermal impedance curves

See MIL-PRF-19500

Subgroups 5 and 6

Not applicable

45 devices

Subgroup 8

Resistance to glass

1057

Condition B. Cool down after solder immersion is

cracking

permitted. Test until failure occurs on all devices

with the chosen sample or to a maximum of 25

cycles, whichever comes first.