MIL-PRF-19500-127 Semiconductor Devices, Diode, Silicon, Voltage Regulator, Types 1N4370A 1 Through 1N4372A-1 And 1N746A-1 Through 1N759A-1, 1N4370Aur-1 Through 1N4372Aur-1 And 1N746Aur-1 Through 1N759Aur-1, 1N4370C-1 Through 1N4372C-1 And 1N746C-1 Through 1N759C-1, 1N4370Cur-1 Through 1N4372Cur 1 And 1N746Cur-1 Through 1N759Cur-1, 1N4370D-1 Through 1N4372D-1 And 1N746D-1 Through 1N759D-...This specification covers the performance requirements for 500 milliwatt, silicon, voltage regulator diodes with voltage tolerances of 5, 2, and 1 percent. Three levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two levels of product assurance is provided for each unencapsulated device.

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MIL-PRF-19500/127W

4. VERIFICATION

4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:

a. Qualification inspection (see 4.2).

b. Screening (see 4.3).

c. Conformance inspection (see 4.4).

4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified

herein.

4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In

case qualification was awarded to a prior revision of the specification sheet that did not request the performance of

table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on

the first inspection lot of this revision to maintain qualification.

4.2.2 JANHC and JANKC devices. JANHC and JANKC devices shall be qualified in accordance with appendix G

of MIL-PRF-19500.

4.2.3 Construction verification. Cross sectional photos from three devices shall be submitted in the qualification

report.

4.3 Screening (JAN, JANTX, and JANTXV levels only). Screening shall be in accordance with table E-IV of

MIL-PRF-19500 and as specified herein. The following measurements shall be made in accordance with table I

herein. Devices that exceed the limits of table I herein shall not be acceptable.

Screen

Measurement

(see table E-IV of

JANTX and JANTXV levels

MIL-PRF-19500)

Temperature cycling

(1) 3c

Thermal impedance (see 4.3.2)

Not applicable

Optional

Not applicable

IR1 and VZ2

See 4.3.3

IR1  100 percent of initial reading or 50 nA dc,

(2) 13

whichever is greater.

VZ2  2 percent initial reading.

Subgroup 2 of table I herein.

14a

Not applicable

(3) 14b

Required

(1) Thermal impedance shall be performed any time after sealing provided temperature cycling is performed in

accordance with MIL-PRF-19500, screen 3 prior to this thermal test.

(2) PDA = 5 percent for screen 13 applies to IR1 and VZ2, and IR1 and VZ2. Thermal impedance (ZJX) is not

required in screen 13 of 4.3 herein.

(3) For clear glass diodes, the hermetic seal (gross leak) may be performed at anytime after temperature cycling.