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MIL-PRF-19500-168 Semiconductor Device, Thyristors \(Controlled Rectifiers\), Silicon, Types 2N1771A, 2N1772A, 2N1774A, 2N1776A, 2N1777A, 2N1778A, And 2N2619A, Jan, Jantx, And JantxvThis specification covers the performance requirements for PNPN, silicon power, reverse-blocking triode thyristors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/168K
* 4.3 Screening (JANTX and JANTXV level). Screening shall be in accordance with table E-IV of MIL-PRF-19500,
and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that
exceed the limits of table I herein shall not be acceptable.
Screen
Measurement
(see table E-IV of
JANTX and JANTXV levels
3a
Condition F, 10 cycles.
10
Not required.
IRRM1, IDRM1, VGT1, VTM.
11
Method 1040 of MIL-STD-750, condition A, TC = +145°C minimum,
12
RGK ≥ 1KΩ; VRRM, VDRM = rated (see 1.4.1).
Subgroup 2 of table I herein, ĆIRRM1 = 100 percent of initial value or +1.0 mA (pk),
13
whichever is greater.
ĆIDRM1 = 100 percent of initial value or +1.0 mA (pk), whichever is greater.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as specified
herein. If alternate screening is being performed in accordance with MIL-PRF-19500, a sample of screened devices
shall be submitted to and pass the requirements of table I, subgroups 1 and 2 inspection only (table E-VIB, group B,
subgroup 1 of MIL-PRF-19500 is not required to be performed again if group B has already been satisfied in
accordance with 4.4.2).
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIB (JANTX and JANTXV) of MIL-PRF-19500 and as follows. Electrical measurements
(end-points) shall be in accordance with the applicable steps of table II herein.
* 4.4.2.1 Group B inspection, table E-VIB (JANTX and JANTXV) of MIL-PRF-19500.
Method
Condition
Subgroup
B2
1051
Test condition F, 15 cycles.
B2
4066
ITSM = 60 A(pk) (0.5 sine wave); 10 surges 1 per minute; IO = 4.7 A at rated VRRM;
TC = +65°C; f = 60 Hz; surge duration = 7 ms, minimum.
TC = +118°C, ±5°C, 50 min "on", IO = 1.25 A, TC uncontrolled, 10 minutes "off".
B3
1026
B5
Not applicable.
5



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