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MIL-PRF-19500-199 Semiconductor Device, Diode, Silicon, Forward-Voltage Regulator, Type 1N816, JanThis specification covers the performance requirements for silicon, forward-voltage regulator, with a nominal forward-voltage drop of 0.64 V dc at 1 mA dc and with the following ratings and characteristics. One level of product assurance is provided for each type of device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/199D
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Conformance inspection (see 4.3).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
* 4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not request the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
4.3 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.3.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein. End-point electrical measurements shall be in accordance with table I, subgroup 2 herein.
4.3.1.1 Thermal impedance ZΘJX measurements. Thermal impedance ZΘJX measurements shall be
performed in accordance with method 3101 of MIL-STD-750.
* 4.3.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIb of MIL-PRF-19500.
4.3.2.1 Group B inspection, table E-VIb of MIL-PRF-19500.
Subgroup
Method
Condition
B3
1027
If = 150 mA dc, VRWM = 6 V (pk) (see 4.4.1).
B5
Not applicable.
* 4.3.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with the table I, subgroup 2 herein.
Method
Condition
Subgroup
C2
2036
Lead fatigue: Test condition E.
L = .375 inch (9.53 mm), RΘJL = 250°C/W maximum; (see 4.3.2),
* C5
4081
22 devices, c = 0.
C6
1026
If = 150 mA dc, VRWM = 6 V (pk) (see 4.4.1).
* 4.3.4 Group E inspection. Group E inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E-IX of MIL-PRF-19500, and table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
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