MIL-PRF-19500-358 Semiconductor Device, Diode, Silicon, Voltage Regulator, Types 1N3305B Through 1N3350B And Rb, 1N4549B Through 1N4554B And Rb, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for 50 watt, silicon, voltage regulator diodes: B type \(standard polarity\) and RB type\(reverse polarity\). Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/358F

* 4.3 Screening (JANS, JANTXV, and JANTX levels only). Screening shall be in accordance with table E-IV of

MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I

herein. Devices that exceed the limits of table I herein shall not be acceptable.

Screen

Measurement

(see table E-IV of

JANS level

JANTX and JANTXV levels

MIL-PRF-19500)

(1) 3C

Thermal impedance, see 4.3.2.

IR1 and VZ (for devices with VZ (nom) ≥ 10 V dc;

Not applicable.

see column 1 of table III).

IR1 and VZ; ĆIR1 = 100 percent of initial value or

2 �A dc, whichever is greater; ĆVZ = �1 percent of

IR1 and VZ

initial value (for devices with VZ(nom) ≥ 10 V dc;

see column 2 of table III).

See 4.3.1.

Subgroup 2 (except forward voltage test) and

Subgroup 2 (except forward voltage test)

subgroup 3 of table I herein; ĆIR1 = 100 percent of

of table I herein; ĆIR1 = 100 percent of

initial value or 2 �A dc, whichever is greater, ĆVZ

initial value or 2 �A dc, whichever is

greater, ĆVZ = �1 percent of initial value.

= �1 percent of initial value.

* (1) This test shall be performed anytime after screen 3.

* 4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: IZ: Column 4 of table III at TJ = 150�C

minimum.

* 4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method

3101 or 4081 of MIL-STD-750, as applicable, using the guidelines in that method for determining IM, IH, tH, tSW (VC

and VH where appropriate). Measurement delay time (tMD) = 70 �s max.

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as

specified herein. Group A inspection shall be performed on each sublot.

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I

herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions

specified for subgroup testing in table E-VIa (JANS) and table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500

and herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein. Delta

measurements shall be in accordance with table II herein.