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MIL-PRF-19500-385 Semiconductor Device, Field Effect Transistors, N-Channel, Silicon Types 2N4856 Through 2N4861, 2N4856Ub Through 2N4861Ub, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for N-channel, depletion mode, silicon J-FET transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF 19500.

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MIL-PRF-19500/385H
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in tables VIA (JANS) and VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and as follows.
Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein. Delta measurements
shall be in accordance with table II herein.
4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500.
Subgroup Method
Condition
PT = 360 mW at TA = +30C, 5C; 2,000 cycles.
B4
1037
96 hours; VDS = 15 V dc; ID = 24 mA at TA = +100C; or adjust as required by the
B5
1027
chosen TA to give an average lot TJ = +275C.
4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup Method
Condition
VGS = -32 V dc for 2N4856, 2N4857, 2N4858, at TA = +175C 5C; VDS = 0 V.
B3
1027
VGS = -24 V dc for 2N4859, 2N4860, 2N4861, at TA = +175C 5C; VDS = 0 V.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein. Delta measurements shall be in accordance with table II herein.
Subgroup Method
Condition
C2
2036
Test condition E, (not applicable to UB suffix device).
VGS = -32 V dc for 2N4856, 2N4857, 2N4858, at TA = +175C 5C; VDS = 0 V.
C6
1026
VGS = -24 V dc for 2N4859, 2N4860, 2N4861, at TA = +175C 5C; VDS = 0 V.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table III herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein. Delta measurements shall be in accordance with table
II herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
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