MIL-PRF-19500/412F
* 4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Measurement
Screen (see table E-IV
of MIL-PRF-19500)
JANS level
JANTX and JANTXV level
(1) 3c
Thermal impedance (see 4.3.2).
Thermal impedance (see 4.3.2).
9
Not applicable
ICES and hFE3 of table I shall be measured
and the data recorded.
11
ICES and hFE3 of table I shall be retested and
ICES and hFE3 of table I shall be measured and
the data recorded.
the data recorded.
ĆICES = 100 percent or 2 µA, whichever is
greater.
ĆhFE3 = ±20 percent.
12
See 4.3.1.
See 4.3.1.
13
Subgroups 2 of table I herein;
Subgroups 2 of table I herein;
ICES and hFE3 of table I shall be retested and
ICES and hFE3 of table I shall be retested and the
the data recorded.
data recorded.
ĆICES = 100 percent or 2 µA, whichever is
ĆICES = 100 percent or 2 µA, whichever is
greater.
greater.
ĆhFE3 = ±20 percent.
ĆhFE3 = ±20 percent.
For TO-254AA packages: Method 1081
For TO-254AA packages: Method 1081 of
17
of MIL-STD-750 (see 4.3.3), Endpoints:
MIL-STD-750 (see 4.3.3), Endpoints:
Subgroup 2 of table I herein
Subgroup 2 of table I herein
*
(1) Shall be performed anytime after temperature cycling, screen 3a; JANTX and JANTXV levels do not need to
be repeated in screening requirements.
4.3.1 Power burn-in conditions. VCB = 10 - 30 V dc, power shall be applied to the device to achieve a junction
temperature, TJ = +175°C minimum.
4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with
method 3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tMD (and VC where
appropriate). The thermal impedance limit used in screen 3c of 4.3 herein and subgroup 2 of table I shall comply with
the thermal impedance graph in figures 6 and 7 (less than or equal to the curve value at the same tH time) and shall
be less than the process determined statistical maximum limit as outlined in method 3131.
7
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