MIL-PRF-19500/522A
3.4 Marking. Devices shall be marked in accordance with MIL-PRF-19500. At the option of the manufacturer, the marking of the
country of origin may be omitted from the body of the transistor.
3.5 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as
specified in 1.3, 1.4, and table I.
3.6 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I.
3.7 Qualification. Devices furnished under this specification shall be products that are authorized by the qualifying activity for listing
on the applicable qualified products list before contract award (see 4.2 and 6.4 ).
4. VERIFICATION
4.1 Classification of Inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3)
c. Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified herein.
4.3 Screening (JANTX and JANTXV levels only). Screening shall be in accordance with MIL-PRF-19500 (table IV), and as specified
herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I herein
shall not be acceptable.
Measurement
Screen (see table IV
of MIL-PRF-19500)
JANTX and JANTXV levels
10
48 hours minimum
11
ICBO and hFE
12
See 4.3.1
13
Subgroup 2 of table I;
ĆhFE = ±15 percent of initial value.
1/ Hermetic seal test shall be performed in either screen 7 or screen 14.
4.3.1 Power burn-in. Power burn-in conditions are as follows:
TA = Room ambient as defined in the general requirements of MIL-STD-750, section 4.5;
2N6603: VCB ≥ 15 V dc; PT = 300 mW.
2N6604: VCB ≥ 15 V dc; PT = 350 mW.
4
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