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MIL-PRF-19500-522 Semiconductor Device, Transistor, Npn, Silicon, High-Frequency Types 2N6603 And 2N6604 Jan, Jantx, And JantxvThis specification covers the performance requirements for NPN, silicon, microwave transistors. Three levels of product assurance are provided for the device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/522A
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as specified herein. Group A
inspection shall be performed on each sublot.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in
table VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and paragraph 4.4.2.1 herein. Electrical measurements (end-points) shall be
in accordance with table I, group A, subgroup 2 herein.
4.4.2.1 Group B inspection, table VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
VCB ≥ 15 V dc; adjust PT to achieve TJ = +150°C min, TA ≤ 35°C. No heat sink or forced-air cooling on
B3
1027
the devices shall be permitted.
TA = +200°C.
B6
1032
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in
table VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in accordance with table I, group A, subgroup
2 herein.
Subgroup
Method
Condition
C2
2036
Test cond. A, weight = 5 lbs, t = 15 seconds each terminal.
VCB ≥ 15 V dc; adjust PT to achieve TJ = +150°C min, TA ≤ 35°C. No heat sink or forced-air cooling on
C6
1026
the devices shall be permitted.
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5.2 Power Gain, Noise Figure and GNF: The device shall be tested in the circuits of figures 2 or 3. The specified conditions shall be
applied and the slide screw tuners adjusted to obtain maximum power output for the Gpe test and minimum noise figure for NF and GNF
tests.
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