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MIL-PRF-19500-526 Semiconductor Device, Transistor, Npn, Silicon, Power, Type 2N3879, Jan, Jantx, And JantxvThis specification covers the performance requirements for NPN, silicon, power transistors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/526H
* TABLE II. Group E inspection (all quality levels) for qualification and re-qualification only.
Inspection
Sample plan
Method
Conditions
Subgroup 1
45 devices
c=0
Temperature cycling
1051
500 cycles
Hermetic seal
1071
Fine leak
Gross leak
Electrical measurements
Table I, subgroup 2
Subgroup 2
45 devices
c=0
Test temperature = +125°C; VCB = 80 percent
Blocking life
1048
of rated; T = 1,000 hours.
Electrical measurements
See table I, subgroup 2
Subgroup 4
Sample size
N/A
Thermal impedance curves
Subgroup 8
45 devices
c=0
Reverse stability
1033
Condition B
12



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