MIL-PRF-19500/526H
* TABLE I. Group A inspection.
Limits
Symbol
Unit
Inspection 1/
Method
Conditions
Min
Max
Subgroup 1 2/
*
2071
Visual and mechanical 3/
examination
Solderability 3/
2026
*
Resistance to 3/ 4/
1022
*
solvent
*
Temp cycling 3/
1051
Test condition C, 25 cycles
*
Hermetic seal
1071
Fine leak
Gross leak
Table I, subgroup 2
Electrical measurements
Pre-condition TA = +250°C at t = 24
Bond strength 3/
2037
hours or TA = +300°C at t = 2 hours,
n = 11 wires, c = 0
Decap internal visual
2075
n = 4, c = 0
Subgroup 2
°C/W
Thermal impedance 5/
3131
See 4.3.2
ZθJX
*
Breakdown voltage,
3011
Bias condition D; IC = 200 mA dc;
V(BR)CEO
75
V dc
pulsed (see 4.5.1)
collector to emitter
Collector to emitter
3041
Bias condition D; VCE = 50 V dc
ICEO
5
mA dc
cutoff current
µA dc
Collector to emitter
3041
Bias condition A; VCE = 100 V dc;
ICEX1
10
cutoff current
VBE = 1.5 V dc
Emitter to base
3061
Bias condition D; VEB = 7 V dc
IEBO
10
mA dc
cutoff current
Collector to base
3036
Bias condition D; VCB = 120 V dc
ICBO
10
µA dc
cutoff current
Base emitter voltage
3066
Test condition B; IC = 4.0 A dc;
VBE
1.8
V dc
(nonsaturated)
Base emitter voltage
3066
Test condition A; IC = 4.0 A dc;
VBE(SAT)
2.0
V dc
(saturated)
Collector to emitter
3071
IC = 4.0 A dc; IB = 0.4 A dc;
VCE(SAT)
1.2
V dc
saturated voltage
pulsed (see 4.5.1)
See footnotes at end of table.
8
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business