MIL-PRF-19500/544H
* TABLE I. Group A inspection.
Inspection 1/
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 1 2/
*
Visual and mechanical
2071
examination 3/
Solderability 3/ 4/
2026
1022
Resistance to solvents
3/ 4/ 5/
Temp cycling 3/ 4/
1051
Test condition C, 25 cycles
Hermetic seal 4/ 6/
1071
Fine leak
Gross leak
Electrical measurements 4/
Group A, subgroup 2
Bond strength 3/ 4/
2037
Precondition
TA = +250°C at t = 24 hours or
TA = +300°C at t = 2 hours
Decap internal visual
2075
n = 4 devices, c = 0
(design verification) 4/
Subgroup 2
°C/W
Thermal impedance 7/
3131
See 4.3.3
ZθJX
Breakdown voltage,
3011
80
V dc
V(BR)CEO
Bias condition D, IC = 100 mA dc;
collector to emitter
µA dc
Collector to emitter cutoff
3041
1.0
Bias condition C, VCE = 60 V dc;
ICES1
current
VBE = 0
Collector to emitter cutoff
3041
1.0
mA dc
Bias condition C, VCE = 100 V dc;
ICES2
current
VBE = 0
µA dc
Collector to emitter cutoff
3041
50
Bias condition D, VCE = 40 V dc,
ICEO
current
IB = 0
See footnotes at end of table.
13
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