MIL-PRF-19500-566 Semiconductor Device, Transistor, Field Effect, N-Channel, Silicon, Logic Level, Types 2N6902, And 2N6904 Jan, Jantx, Jantxv And JansThis specification covers the performance requirements for logic level, N-channel, enhancement-mode, MOSFET, power transistor. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14

MIL-PRF-19500/566C

* TABLE II. Group E inspection (all quality levels) for qualification or re-qualification only.

Qualification and

Inspection

MIL-STD-750

large lot quality

conformance

Method

Conditions

inspection 1/

Subgroup 1

45 devices

c=0

Temperature cycle

1051

Condition G, 500 cycles

Hermetic seal

1071

Fine leak

Gross leak

Electrical measurements

See table I, subgroup 2

Subgroup 2 1/

45 devices

c=0

Steady-state reverse bias

1042

Condition A, 1,000 hours

Electrical measurements

See table I, subgroup 2

Steady-state gate bias

1042

Condition B, 1,000 hours

Electrical measurements

See table I, subgroup 2

Subgroup 4

sample size

N/A

See MIL-PRF-19500

Thermal impedance curves

Subgroup 5

Not applicable

Subgroup 10

Commutating diode for safe operating

3476

Test conditions shall be derived by

22 devices

area test procedure for measuring

the manufacturer

c=0

dv/dt during reverse recovery of

power MOSFET transistors or

insulated gate bipolar transistors

1/ A separate sample for each test may be pulled.