For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-566 Semiconductor Device, Transistor, Field Effect, N-Channel, Silicon, Logic Level, Types 2N6902, And 2N6904 Jan, Jantx, Jantxv And JansThis specification covers the performance requirements for logic level, N-channel, enhancement-mode, MOSFET, power transistor. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14


. . . . . . . . . .
MIL-PRF-19500/566C
* 4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500.
Subgroup
Method
Conditions
*
B3
1051
Test condition G
*
B3
2075
See 3.4.2.
B4
1042
Test condition D, 2,000 cycles minimum, the heating cycle shall be 1 minute
minimum.
Test condition A; VDS = rated VDS (see 1.3), TA = +175° C, t = 120 hours
*
B5
1042
minimum, read and record VBR(DSS) (pre and post) at ID = 1 mA, read and record
IDSS (pre and post), (see table I).
Test condition B; VGS = rated VGS (see 1.3), TA = +175° C, t = 24 hours
*
B5
1042
minimum.
4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Conditions
*
B2
1051
Test condition G
B3
1042
Test condition D; 2,000 cycles minimum. The heating cycle shall be 1 minute
minimum.
*
B4
2075
See 3.4.2.
* 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500. End-point electrical and delta measurements shall be in
accordance with table I, subgroup 2 herein.
Subgroup
Method
Conditions
*
C2
2036
Test condition A; weight = 10 lbs., t = 15 s.
*
C5
3161
See 4.3.3.
C6
1042
Test condition D; 6,000 cycles minimum. The heating cycle shall be 1 minute
minimum.
* 4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
9



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.