MIL-PRF-19500/583B
* TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 1 2/
n = 45 devices, c = 0
2071
Visual and mechanical 3/
examination
2026
n = 15 leads, c = 0
Solderability 3/
Resistance to 3/ 4/
1022
n = 15 devices, c = 0
solvent
Temp cycling 3/
1051
Test condition C, 25 cycles.
n = 22 devices, c = 0
Hermetic seal
1071
n = 22 devices, c = 0
Fine leak
Gross leak
Electrical measurements
Group A, subgroup 2
Pre-condition TA = +250°C at t = 24
2037
Bond strength 3/
hrs or TA = +300°C at t = 2 hrs,
n = 11 wires, c = 0
Subgroup 2
3011
Bias condition D, pulsed (see 4.5.1)
V(BR)CEO
V dc
Breakdown voltage
IC = 10 mA dc
collector to emitter
100
2N5681
120
2N5682
Collector emitter cutoff
3041
Bias condition A, VBE = 1.5 V dc
ICEX1
100
nA dc
current
VCE = 100 V dc
2N5681
2N5682
VCE = 120 V dc
µA dc
Collector emitter cutoff
3041
Bias condition D
ICEO
10
current
VCE = 70 V dc
2N5681
VCE = 80 V dc
2N5682
Collector to baser cutoff
3036
Bias condition D
ICBO
100
nA dc
current
VCE = 100 V dc
2N5681
VCE = 120 V dc
2N5682
µA dc
3061
Bias condition D, VEB = 4.0 V dc
1.0
Emitter to base cutoff
IEBO
current
See footnotes at end of table.
10
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