MIL-PRF-19500/583B
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 2 Continued
3076
Pulsed (see 4.5.1), IC = 250 mA dc
hFE1
40
150
Forward current transfer
ratio
VCE = 2.0 V dc
Forward current transfer
3076
Pulsed (see 4.5.1), IC = 500 mA dc
hFE2
20
ratio
VCE = 2.0 V dc
Pulsed (see 4.5.1), IC = 1.0 A dc
3076
Forward current transfer
hFE3
5
ratio
VCE = 2.0 V dc
Collector to emitter voltage
3071
Pulsed (see 4.5.1), IC = 250 mA dc
VCE(sat)1
0.6
V dc
(saturated)
IB = 25 mA dc
Collector to emitter voltage
3071
Pulsed (see 4.5.1), IC = 500 mA dc
VCE(sat)2
1.0
V dc
(saturated)
IB = 50 mA dc
Base emitter voltage
3066
Test condition A, pulsed (see 4.5.1),
VBE(sat)1
1.1
V dc
IC = 250 mA dc , IB = 25 mA dc
Base emitter voltage
3066
Test condition A, pulsed (see 4.5.1),
VBE(sat)2
1.3
V dc
IC = 500 mA dc , IB = 50 mA dc
Subgroup 3
TA = +150°C
High temperature
operation:
1.0
mA dc
ICEX2
3041
Bias condition A, VBE = 1.5 V dc
Collector to emitter cutoff
current
VCE = 100 V dc
2N5681
2N5682
VCE = 120 V dc
TA = -55°C
Low-temperature
operation:
Forward current transfer
3076
Pulsed (see 4.5.1), IC = 250 mA dc
hFE4
20
ratio
VCE = 2.0 V dc
See footnotes at end of table.
11
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