MIL-PRF-19500/623D
3.6 Electrical test requirements. The electrical test requirements shall be as specified in table I.
3.7 Marking. Marking shall be in accordance with MIL-PRF-19500.
3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not request the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
* 4.3 Screening (JANS, JANTX and JANTXV levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Measurement
Screen (see table E-IV
JANS level
JANTX and JANTXV levels
of MIL-PRF-19500)
(1) 3c
Thermal impedance (see 4.3.2)
Thermal impedance (see 4.3.2)
9
Not applicable
ICEX1 and hFE1
11
Subgroup 2 of table I herein;
ICEX1 and hFE1
ICEX1 and hFE1;
ĆICEX1 = 100 percent of initial value or
-2 µA dc, whichever is greater.
ĆhFE1 = ± 40 percent of initial value.
12
See 4.3.1
See 4.3.1
13
Subgroups 2 and 3 of table I herein;
Subgroup 2 of table I herein;
ICEX1 and hFE1;
ICEX1 and hFE1;
ĆICEX1 = 100 percent of initial value or
ĆICEX1 = 100 percent of initial value or
-2 µA dc, whichever is greater.
-2 µA dc, whichever is greater.
ĆhFE1 = ± 40 percent of initial value.
ĆhFE1 = ± 40 percent of initial value.
(1) Shall be performed anytime after temperature cycling, screen 3a; and does not need to be repeated in
screening requirements.
4
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