MIL-PRF-19500/623D
* TABLE I. Group A inspection.
Inspection 1/
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
examination
Subgroup 2
Thermal impedance
3131
See 4.3.2
ZθJC
Collector - emitter
3011
-100
V dc
VCEO(sus)
Bias condition D; IC = -100 mA dc
breakdown voltage
pulsed (see 4.5.1)
Collector - emitter
3036
-1.0
mA dc
ICEO
Bias condition D; VCE = -50 V dc
cutoff current
Emitter - base
IEBO
3061
-2.0
mA dc
Bias condition D; VEB = -5 V dc
cutoff current
µA dc
Collector - emitter
3041
-20
ICEX1
Bias condition A; VBE = -1.5 V dc;
cutoff current
VCE = -100 V dc
Base - emitter
3066
-4.0
V dc
VBE(sat)
Test condition A; IC = -12 A dc;
saturated voltage
IB = -120 mA dc; pulsed (see
Collector - emitter
3071
-3.0
V dc
VCE(sat)
IC = -12 A dc; IB = -120 mA dc;
saturated voltage
pulsed (see 4.5.1)
Forward - current
3076
1000
18,000
hFE1
VCE = -3.0 V dc; IC = -6.0 A dc
transfer ratio
pulsed (see 4.5.1)
Forward - current
3076
150
hFE2
VCE = -3.0 V dc; IC = -12 A dc
transfer ratio
pulsed (see 4.5.1)
Subgroup 3
TA = +150°C
High - temperature
operation:
Collector to emitter
3041
-1.0
mA dc
ICEX2
Bias condition C; VCE = -100 V dc;
cutoff current
VBE = -1.5 V dc
TA = -55°C
Low - temperature
operation:
Forward - current
3076
300
hFE3
VCE = -3.0 V dc IC = -6.0 A dc
transfer ratio
pulsed (see 4.5.1)
See footnotes at end of table.
7
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