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MIL-PRF-19500-623 Semiconductor Device, Darlington Transistor, Pnp, Silicon, High-Power Type 2N7371 Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for PNP silicon, high-power Darlington transistor. Four levels of product assurance are provided as specified in MIL-PRF-19500.

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MIL-PRF-19500/623D
*
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows:
TJ = +175°C min, VCE = -10 to -30 V dc, TA = +30 ±5°C.
4.3.2 Thermal impedance (ZθJX measurements). The ZθJX measurements shall be performed in accordance with
method 3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, and tMD (and VC where
appropriate). The ZθJX limit used in screen 3c shall comply with the thermal impedance graph on figure 3 (less than
or equal to the curve value at the same tH time) and/or shall be less than the process determined statistical maximum
limit as outlined in method 3131.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with appendix E, table V of
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIA (JANS) and table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500, and herein.
Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.4.2.1 Group B inspection (JANS), table E-VIA of MIL-PRF-19500.
*
Subgroup
Method
Condition
VCB ≥ -10 V dc.
*
B4
1037
B5
1027
Bond strength, test condition A.
See 4.5.2.
B6
3131
*
4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Conditions
VCB ≥ -10 V dc, 2,000 cycles.
B3
1037
*
See 4.5.2.
B5
3131
TA = +200°C.
B6
1032
*  4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the test and conditions
specified for subgroup testing in table E-VII of MIL-PRF-19500. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
Subgroup
Method
Condition
C2
1056
Test condition B.
C2
2036
Test condition A, weight = 4.5 kg, t = 10 seconds.
VCB ≥ -10 V dc.
*
C6
1037
5



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