MIL-PRF-19500P
APPENDIX E
E.4.2 Inspection routine. All samples subjected to groups B, C, D, and E shall have been chosen from a lot which
has passed the requirements for group A except as modified in E.6.5. The following conditions apply:
a.
The required sample plan for series of devices shall consist of group A inspection for the highest and the
lowest voltage types or as the qualifying activity requires.
b.
A sample from one sublot shall be tested for each group B subgroup. One device representing each
process variation within the series to be qualified shall be submitted to the design verification examination.
If devices within the series differ only by electrical selection, then only one type needs to be submitted to
design verification.
c.
A sample from one sublot shall be tested for each group C subgroup. At the option of the manufacturer,
devices from group B, tables E-VIA and E-VIB, may be continued on in group C, subgroup 6, to achieve
1,000 hours or 6,000 cycles total, or separate samples may be used.
d.
When group D (RHA) qualification extension is granted, the radiation facility shall be approved by the
qualifying activity. A sample from a sublot of each device type shall be tested for each group D subgroup.
e.
Devices which are constructed using braided leads may be processed through table E-IV screening and
qualification high temperature testing prior to the addition of leads. Qualification testing requiring load
current conduction will require that leads be attached.
E.4.2.1 Qualification to electrostatic discharge sensitivity (ESDS) classes. Initial qualification to an ESDS class or
requalification after redesign shall consist of qualification to the appropriate quality and reliability level plus ESDS
classification in accordance with test method 1020 of MIL-STD-750. In addition, when only a partial requalification to
the appropriate quality and reliability level is required in accordance with appendix E, E.6.6, or in accordance with
appendix E, table E-III testing guidelines for changes to a qualified product, ESD classification is required to be
performed in accordance with test method 1020 of MIL-STD-750. All currently qualified devices specified in the
current revision of 19500 QML database as ESD classes 1 or 3 shall be ESD tested by the respective manufacturers
to determine correct device ESD classification (1A, 1B, 1C, 3A, or 3B) within 1 year after this revision has been
dated.
a.
Although little variation due to case outline is expected, if a device type is available in more than one
package type or case outline, ESDS testing and classification shall be applied to at least that one package
type shown by experience to be worst case for ESDS. ESDS classification test results shall be submitted
to the qualifying activity for all specification sheets for listing. Specifications using structurally identical die
designs may be classified with data from previously classified types. Any dissimilar designs within a
specification sheet shall have ESDS classifications for each structurally identical grouping.
b.
All power bi-polar transistors and rectifiers, except schottkys, are considered to be at least class 3A by
design. Schottky case mounted rectifiers may be designated class 3A, upon successful completion of a 2
ampere reverse energy test. Other schottky rectifier package configurations may be designated class 3A, if
they pass a reverse energy test which has been demonstrated to correlate with class 3A classification.
c.
All zeners, (voltage reference and voltage regulators) and transient suppressors are considered
non-sensitive by design.
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