MIL-PRF-19500 Semiconductor Devices, General Specification ForThis specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process controls to mitigate risk. Mission assurance and standardization of parts are the highest priorities. This specification establishes a heritage program of semiconductor devices the military and space community can rely on to be dependable and available. Detail requirements and characteristics are specified in the specification sheets. Revisions to this specification and specification sheets are structured to assure the interchangeability of devices of the same part type regardless of manufacturing date code or conformance inspection \(CI\) completion date. Four quality levels for encapsulated devices are provided for in this specification, differentiated by the prefixes JAN, JANTX, JANTXV, and JANS. Eight radiation hardness assurance \(RHA\) levels are provided for the JANTXV and JANS quality levels. These are designated by the letters M, D, P, L, R, F, G, and H following the quality level portion of the prefix. Two quality levels for unencapsulated devices are provided for in this specification, differentiated by the prefixes JANHC and JANKC.

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MIL-PRF-19500P

APPENDIX E

Group A variables data on a sample plan of each structurally identical device type except for series of devices

which shall be the sample plan of the highest and the lowest voltage types, or as the qualifying activity

requires, or as specified in specification sheets covering groups of devices. Test samples of selected devices

in a group or portion of a group shall be from the same inspection lot.

Results and variables data for each structurally identical device on all groups B and C electrical tests not

specified in group A, including tests at temperature extremes.

All results and variables data on groups B and C tests as follows:

(1)

Data on any tests not required by the qualified device.

(2)

Data that is the result of tests performed at stress levels greater than those required for the qualified

device.

(3)

Data for any tests requiring more exacting limits than those found for the qualified device.

Items E.4.2.2.d through E.4.2.2.f shall not be required if the qualifying activity can be assured that the

previously fully qualified device at least meets all of the conditions and requirements for the proposed

structurally identical device type, except for device type marking.

Qualification by extension does not necessarily imply conformance inspection coverage to all device types covered

by the qualification by extension approval.

E.4.3 End-points. End-point electrical measurements shall be measured and recorded as applicable (e.g., if

delta's are required) starting and after completion of all specified tests in the subgroups of groups B, C, D and E.

Pre-test electrical failures shall be replaced by acceptable devices. An engineering evaluation shall be performed

and corrective action taken when necessary on all screened devices which fail pre-test. Resubmission of the lot to

the failed parameter shall be initiated whenever operator error or mishandling is not found to be the cause for failure.

E.4.4 Selection of samples. All samples shall be randomly selected from the qualification inspection lot. Sample

selection for group D testing shall be in accordance with table E-VIII and shall be from each wafer or from each

inspection lot, as appropriate.

E.4.5 Identification of samples. The manufacturer's management representative may, at their option, mark or

authorize the marking of each sample to be subjected to qualification testing in order to distinguish these devices

from those not intended for qualification inspection.

E.4.6 Qualification inspection lot release. The inspection lot from which the qualification samples are selected may

be offered for delivery under contract after qualification approval has been granted provided screening and

conformance inspection requirements are satisfied.