An Integrated Publishing, Inc. Site

An Integrated Publishing Website

MIL-PRF-19500 Semiconductor Devices, General Specification ForThis specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process controls to mitigate risk. Mission assurance and standardization of parts are the highest priorities. This specification establishes a heritage program of semiconductor devices the military and space community can rely on to be dependable and available. Detail requirements and characteristics are specified in the specification sheets. Revisions to this specification and specification sheets are structured to assure the interchangeability of devices of the same part type regardless of manufacturing date code or conformance inspection \(CI\) completion date. Four quality levels for encapsulated devices are provided for in this specification, differentiated by the prefixes JAN, JANTX, JANTXV, and JANS. Eight radiation hardness assurance \(RHA\) levels are provided for the JANTXV and JANS quality levels. These are designated by the letters M, D, P, L, R, F, G, and H following the quality level portion of the prefix. Two quality levels for unencapsulated devices are provided for in this specification, differentiated by the prefixes JANHC and JANKC.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16

MIL-PRF-19500P

APPENDIX E

PRODUCTION PROCESS

1. RAW MATERIAL

CONFORMANCE

REVIEW OF

2. FACTORY PROCESS

INSPECTION LOTS

INSPECTION

GROUPS

3. INTERNAL VISUAL AS

FORMED AFTER

TESTING ON

A, B, AND C

SPECIFIED IN THE

FINAL ASSEMBLY

INSPECTION

SPECIFICATION

LOT TO VERIFY

DATA FOR

OPERATION

SHEET

THE SAMPLE

ACCEPT OR

PLAN OF

REJECT

GROUPS A, B,

SEE NOTE 1

AND C

DEVICES PROPOSED

FOR JANTX/TXV

JAN

ALL SPECIFIED TABLE

ASSURANCE TYPES

E-IV 100-PERCENT

STOCKING

SHALL MAINTAIN

SCREENS FOR JANTX,

ORIGINAL LOT

JANTXV AS APPLICABLE

IDENTITY AND DATE

CODE

SEE NOTES 2 AND 3

SCREENING

VERIFICATION TESTS

REVIEW OF GROUPS

JAN

JANTX OR

A, B, C, AND D (AS

PREPARATION

JANTXV

GROUP A, SUBGROUP 1

APPLICABLE)

FOR DELIVERY

PREPARATION

AND 2

FOR DELIVERY

GROUP B, SUBGROUP 1

FOR LOT ACCEPT OR

AND GROUP D

REJECT

SEE NOTES 4, 5, AND 6

NOTES:

1. All product proposed for JANTXV processing shall have been subjected to and passed JANTXV internal

visual 100-percent screening in accordance with table E-IV herein at this step (except for clear glass

JANTXV diodes which shall be subjected to internal visual prior to body paint or mark).

2. If a JAN inspection lot is not processed in parallel with the material designated for JANTX and JANTXV,

all groups A, B, C, and D testing shall be performed on a JANTX or JANTXV inspection lot as shown on

figure E-1.

3. The order of all screening tests shall be performed as specified in table E-IV.

4. Method 2026 of MIL-STD-750, omit steam ageing, sample size is 15 leads c = 0. This modified B1 testing

cannot be used as a solderability inspection date.

5. Method 1022 of MIL-STD-750, sample size is 15 devices c = 0.

6. If the inspection lot is composed of a collection of sublots, each sublot shall pass full group A inspection

as specified.

FIGURE E-2. Alternate order of procedure diagram for JAN, JANTX, and JANTXV device types.