MIL-PRF-19500P
APPENDIX E
E.6.3.1 Lots shipped prior to group B completion. No lots shall be shipped prior to completion of group B without
the approval of the qualifying activity. This provision is only to be requested for emergency procurement situations
and it is expected that the user will provide a justification.
E.6.4 Group C inspection. Group C inspection shall be in accordance with table E-VII and shall include those tests
specified which are performed periodically at 1-year intervals on at least one device type from each structurally
identical device grouping (from the same or different specification sheet) in which the manufacturer has qualified
device types. This inspection shall be applied only to completed and fully marked devices from lots which have been
subjected to and passed the group A, subgroup 1, 2, and 3 requirements. When the final lead finish is solder, the life
test subgroup may be pulled prior to the application of final lead finish. All tests within a subgroup shall be performed
in the order specified. The test samples may be cleaned prior to the electrical end-point testing. An evaluation shall
be performed on all failures to determine if the failure mode is the result of a latent (time dependent) defect,
workmanship, or design weakness. Appropriate corrective action shall be performed as a result of the evaluation.
Lots with an unscreenable failure mode shall be rejected. Unless all devices intended for manufacturing during that
period will receive, as a minimum, the same screening, devices which have received PIND screening in accordance
with E.5.4.1 may not be used to qualify the next group C inspection periods. A device type which fails a group C
inspection shall not be accepted until the device type which failed, successfully completes the failed group C
subgroup(s). Other device types from the same qualified group represented by the failed device type may be
accepted provided group C inspection requirements have been satisfied for those device types.
Samples from subsequent lots of the device types in the structurally identical device grouping which failed group C
resubmittal inspection, or are withdrawn in a failing state, shall then be subjected to all the tests in the subgroup in
which the failure occurred, on a lot-by-lot basis until three successive lots pass the failed subgroup. The testing may
then return to periodic testing.
E.6.4.1 Group C sample selection. Samples for subgroups in group C shall be chosen at random from the first lot
submitted for conformance inspection during the specified group C inspection interval. Testing of one device type for
each subgroup shall be considered as complying with the requirements for that subgroup for all structurally identical
types (see E.3.2). A different device type(s) shall be tested at each successive inspection interval until all structurally
identical device types qualified on the same or different specification sheet(s), from the same qualified line, have
been tested, except power MOSFETs grouped by the same voltage as described in E.3.2. When none of the
inspection lots passing group A of the first lot submitted contain the device type which is due to be tested, the
samples for inspection shall be chosen from those types in the inspection lots being tested which have not been used
for the longest time for group C inspection. The date code of the lot establishes (begins) the 1-year group C interval.
Groups A and B shall also be completed on the group C inspection lot date code prior to the coverage being valid.
Small lot samples may not be used to satisfy group C requirements for inspection lots of structurally identical devices.
Small lot samples may only be used to satisfy group C for the inspection lot being sampled.
E.6.4.2 Lots shipped prior to group C completion. No lots shall be shipped prior to completion of group C without
the approval of the qualifying activity. This provision is only to be requested for emergency procurement situations
and it is expected that the user will provide a justification.
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