MIL-PRF-19500P
APPENDIX E
TABLE E-VIA. Group B inspections for JANS devices.
Qualification and large
Small lot
Inspections
MIL-STD-750,
MIL-STD-750,
conformance
lot conformance
method
condition
inspection sample plan
inspection
Subgroup 1 1/
Physical dimensions
2066
Dimensions in accordance
22 devices, c = 0
8 devices
with case outline specified in
c=0
specification sheets.
Subgroup 2 1/
Separate samples may be
used for each test.
Solderability
2026
The sample plan applies to
15 leads, c = 0
6 leads
the number of leads
c=0
inspected. A minimum of
three devices shall be tested.
Resistance to solvents
1022
Not required if marking is
15 devices, c = 0
6 devices
etched into the device.
c=0
Subgroup 3
Thermal shock
1056
25 cycles, condition B (glass
22 devices, c = 0
6 devices
(liquid-to-liquid)
diodes only).
c=0
Temperature cycling
1051
Test condition C, or maximum
(air-to-air)
storage temperature,
whichever is less. (100
cycles).
Surge
4066
As specified.
Hermetic seal 2/
1071
a. Fine
Not required for double plug
diodes.
b. Gross
Electrical
Group A, subgroup 2.
measurements
Decap-internal visual
2075
Visual criteria in accordance
6 devices, c = 0
6 devices
(design verification) 3/
with qualified design and
c=0
internal visual precap criteria.
See footnotes at end of table.
107
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