MIL-PRF-19500P
APPENDIX E
TABLE E-VIB. Group B inspections for JAN, JANTX, and JANTXV devices.
Sample
Small lot
MIL-STD-750
Inspections 1/
plan
conformance
inspection
Method
Condition
Separate samples may be used for
Subgroup 1 2/
each test
Solderability
2026
The sample plan applies to the number
15 leads
4 leads
of leads inspected. A minimum of 3
c=0
c=0
devices shall be tested.
Resistance to solvents
1022
Not required if marking is etched into
15 devices
3 devices
the device.
c=0
c=0
22 devices
6 devices
Subgroup 2
c=0
c=0
Thermal shock
1056
10 cycles, condition B, (glass diodes
(liquid-to-liquid)
only).
Temperature cycling
1051
Test condition C, or maximum storage
(air-to-air)
temperature, whichever is less. (45
cycles including screening)
Surge
4066
As specified.
Hermetic seal 3/
1071
Not required for double plug diode.
a. Fine leak
b. Gross leak
Group A, subgroup 2
Electrical measurements 4/
Subgroup 3 5/
45 devices
12 devices
c=0
c=0
Steady-state operation life 6/
1027
Bias conditions as specified, 328 hours
(minimum)
Electrical measurements
Group A, subgroup 2
or
Intermittent operation life 7/
1037
2,000 cycles (minimum)
1042
Condition D, 2,000 cycles (minimum)
1071
Hermetic seal 9/
a. Fine
b. Gross
Group A, subgroup 2
Electrical measurements
Bond strength (wire or clip
2037
Condition D. The sample shall include
11 wires
11 wires
bonded devices only)
a minimum of three devices and shall
c=0
c=0
include all wire sizes.
111
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