MIL-PRF-19500P
APPENDIX G
TABLE G-II. Die element evaluation requirements.
Reference
Subgroup
Class
Test
MIL-STD-750
Quantity
(accept no.)
paragraph
K
H
Method
Condition
Class
K
H
1
X
X
Electrical test
100-percent
G.5.2.1
2
X
X
Visual inspection
2069
100-percent
G.5.2.2
2070
2072
2073
3A
X
X
Internal/die
2069
45 (0)
22 (0)
G.5.2.3.1
visual
2070
inspection
2072
2073
3B
X
X
Sample
45
22
G.5.2.3.2
assembly
pieces
pieces
G.5.2.3.3
min
min
4
45 (0)
22 (0)
X
X
Temperature
1051
C
cycling
X
Mechanical
2016
Y1 axis
shock or
direction
Constant
2006
Y1 axis
acceleration
direction
X
X
Electrical test
Group A,
1/
(read/record)
subgroups 2, 3, 4
X
X
HTRB
Screen 10
2/
X
X
Electrical test
Group A,
1/ 3/
(read/record)
subgroup 2
X
X
Burn-in
Screen 12
2/
X
X
Electrical test
Group A,
1/ 3/
(read/record)
subgroup 2
X
X
Subgroup 3
X
X
Steady-state life
4/
Transistors
1039
B
Power FETS
1042
A
Diodes/rectifiers
1038
A or B
130
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