MIL-PRF-19500 Semiconductor Devices, General Specification ForThis specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process controls to mitigate risk. Mission assurance and standardization of parts are the highest priorities. This specification establishes a heritage program of semiconductor devices the military and space community can rely on to be dependable and available. Detail requirements and characteristics are specified in the specification sheets. Revisions to this specification and specification sheets are structured to assure the interchangeability of devices of the same part type regardless of manufacturing date code or conformance inspection \(CI\) completion date. Four quality levels for encapsulated devices are provided for in this specification, differentiated by the prefixes JAN, JANTX, JANTXV, and JANS. Eight radiation hardness assurance \(RHA\) levels are provided for the JANTXV and JANS quality levels. These are designated by the letters M, D, P, L, R, F, G, and H following the quality level portion of the prefix. Two quality levels for unencapsulated devices are provided for in this specification, differentiated by the prefixes JANHC and JANKC.

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MIL-PRF-19500P

APPENDIX B

ton ............................................................ Turn on time

tp .............................................................. Pulse time

tr ............................................................... Rise time

ts .............................................................. Storage time

tw ............................................................. Pulse average time

V(BR) ....................................................... Breakdown voltage (BV)

Zθ ............................................................. Thermal impedance

B.4 TRANSISTORS SYMBOLS

B.4.1 Junction transistors, multijunction type symbols.

Cibo, Cieo .................................................. Input capacitance, (common base, common emitter) collector open

circuited for ac

Cibs, Cies................................................... Input capacitance, (common base, common emitter) collector short-

circuited to reference terminal for ac

Cobo, Coeo ................................................ Output capacitance, (common base, common emitter) input open

circuited to ac

Cobs, Coes ................................................ Output capacitance, (common base, common emitter) input short-

circuited to reference terminal for ac

fhfb, fhfc, fhfe................................................. Small signal, short-circuit forward current transfer ratio cutoff

frequency (common base, common collector, common emitter)

fmax ........................................................... Maximum frequency of oscillation

fT ................................................................ Extrapolated unity gain frequency

gMB, gMC, gME ......................................... Static transconductance (common base, common collector, common

emitter)

gmb, gmc, gme .......................................... Small signal transconductance (common base, common collector,

common emitter)

GPB, GPC, GPE ........................................ Large signal insertion power gain (common base, common collector,

common emitter)

Gpb, Gpc, Gpe ........................................... Small signal insertion power gain (common base, common collector,

common emitter)

hFB, hFC, hFE ........................................... Static forward current transfer ratio (common base, common

collector, common emitter)