MIL-PRF-19500 Semiconductor Devices, General Specification ForThis specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process controls to mitigate risk. Mission assurance and standardization of parts are the highest priorities. This specification establishes a heritage program of semiconductor devices the military and space community can rely on to be dependable and available. Detail requirements and characteristics are specified in the specification sheets. Revisions to this specification and specification sheets are structured to assure the interchangeability of devices of the same part type regardless of manufacturing date code or conformance inspection \(CI\) completion date. Four quality levels for encapsulated devices are provided for in this specification, differentiated by the prefixes JAN, JANTX, JANTXV, and JANS. Eight radiation hardness assurance \(RHA\) levels are provided for the JANTXV and JANS quality levels. These are designated by the letters M, D, P, L, R, F, G, and H following the quality level portion of the prefix. Two quality levels for unencapsulated devices are provided for in this specification, differentiated by the prefixes JANHC and JANKC.

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MIL-PRF-19500P

APPENDIX D

QUALITY SYSTEM

D.1 SCOPE

D.1.1 Scope. This appendix contains details of the quality system for MIL-PRF-19500 semiconductor devices.

The quality system will address the verification system of appendix E which measures and evaluates the

manufacturer's manufacturing process against a baseline for that process. This baseline can include innovative and

improved processes that result in an equivalent or higher quality product, provided that the process used to evaluate

and document these changes has been reviewed and approved by the qualifying activity (see 4.4). Changes to the

process baseline can be made by the manufacturer after achieving approval with documented reliability and quality

data. The approach outlined in this appendix is a proven baseline, which contains details of a quality system

including best commercial practices. Manufacturers shall demonstrate to the qualifying activity a quality system that

achieves at least the same level of quality as could be achieved by complying with this appendix. Certification is

provided by the qualifying activity upon approval by the preparing activity (for equivalent quality systems) and

qualifying activity. Reduction and alternate test will be approved on a case-by-case basis. A qualified products

supplier is compliant to this appendix. A qualified products supplier is one who exercises a system, which focuses on

product and inspections. The DLA Land and Maritime audit is product, system, and process oriented. This appendix

is a mandatory part of the specification. The information contained herein is intended for compliance.

D.2 APPLICABLE DOCUMENTS

D.2.1 General. The documents listed in this section are specified in sections D.3 or D.4 of this specification. This

section does not include documents cited in other sections of this specification or recommended for additional

information or as examples. While every effort has been made to ensure the completeness of this list, document

users are cautioned that they shall meet all specified requirements of documents cited in sections D.3 or D.4 of this

specification, whether or not they are listed.

D.2.2 Non-Government publications. The following documents form a part of this document to the extent specified

herein. Unless otherwise specified, the issues of the documents are those cited in the solicitation or contract

AMERICAN NATIONAL STANDARDS INSTITUTE (ANSI)

ANSI/NCSL-Z540-1

Calibration Laboratories and Measuring and Test Equipment - General

Requirements.

(Application for copies should be addressed to the American National Standards Institute, 1819 L Street NW, Suite

600, Washington D.C. 20036, www.ansi.org.)

ELECTRONIC INDUSTRIES ALLIANCE (EIA)

EIA-557

Statistical Process Control Systems.

JEDEC Publication 114

Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator

Training and Certification

(Application for copies should be addressed to the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington,

VA 22201-3834, www.jedec.org.)

(Non-Government standards and other publications are normally available from the organizations which prepare or

distribute the documents. These documents also may be available in or through libraries or other informational

services.)