MIL-PRF-19500P
APPENDIX E
E.3.6 Resubmitted lots.
E.3.6.1 Resubmitted lots of JAN, JANTX, JANTXV, and JANS. Resubmitted lots shall be kept separate from new
lots and shall be clearly identified. Any failed lot for group B, or group C may be resubmitted one time only, for the
failed subgroup, at double the large lot sample size with zero additional failures; if it is determined by analysis of all
the failed devices that the failure mechanism is due to a defect that can be effectively removed by rescreening the
entire lot, and that rescreening has been performed. A failed lot which is rescreened (resubmittal to inadvertently
missed process steps or tests is not considered a rescreen) may not be used to satisfy the periodic group C
coverage. The lot may be resubmitted only to the failed subgroup to determine its' own acceptance. Failure analysis
shall be performed on all failed lots. Lots which fail group B, bond strength, decap internal visual, and SEM (when
applicable), shall not be resubmitted. For subgroups A-2, A-3, and A-4, see footnote 7 of table E-V).
E.3.6.2 Resubmitted lots of RHA devices. A JANTXV lot which fails group D tests may be resubmitted once, in
accordance with footnote 4 or 7, as applicable, of table E-VIII. A JANS lot which fails group D, subgroups 1 or 3
tests, may be re submitted once, in accordance with footnote 3 of table E-VIII. JANS wafers which fail group D,
subgroup 2 tests shall not be resubmitted. In lieu of resubmission, a lot or wafer which fails group D testing may be
used as a non-RHA device or may be certified at a lower RHA level if the group D data indicates the lot or wafer
meets the lower level requirements.
E.3.7 Conditions and methods of test. Conditions and methods of test shall be in accordance with MIL-STD-750.
The general requirements of MIL-STD-750 apply as specified. A system for control and calibration of test equipment
shall be established. ANSI/NCSL Z540-1 may be used as guidance for the calibration system.
E.3.7.1 Alternative and equivalent test methods and requirements. Other test methods (flows, criteria, conditions)
or circuits may be substituted for those specified in MIL-STD-750 provided equivalency is demonstrated to, and
approved by, the qualifying activity. Such a substitution will in no way relax the performance requirements of this
specification. The schematic wiring diagram of the test equipment or test methods (including, as applicable, bias
conditions, time, temperature, mounting conditions, etc.) shall be made available for review by the qualifying activity.
The manufacturing site's performance history will be essential criteria for approval. Any design change (in
accordance with table E-III) to a product, using an approved alternate test flow, requires approval by the qualifying
activity.
E.3.7.1.1 In-line conformance inspection. Supplier specific (custom) in-line conformance inspection is permitted in
lieu of group B conformance with the approval of the qualifying activity on continuous production lines.
E.3.7.2 Procedure in case of test equipment failure or human error. If it is determined through a detailed
engineering evaluation that a failed device is the result of test equipment failure or human error, a replacement device
from the same inspection lot may be added to the sample. The replacement device shall be subjected to all those
tests to which the discarded device was subjected prior to its failure and to any remaining specified tests to which the
discarded device was not subjected prior to its failure. Failures occurring as a result of operator error, prior to the
start of testing, may be replaced by the manufacturer but shall be noted on the lot history. Any electrostatic discharge
(ESD) failures shall be counted as rejects and not be attributed to equipment/operator error for qualification,
conformance inspection, screening, group A, and end-point electrical tests of MIL-STD-750. Immediate corrective
action is required whenever failures are attributed to test equipment failure or human error. In all cases, a detailed
report shall be documented and submitted to the qualifying activity within 10 working days. Each occurrence shall be
recorded on the applicable travelers.
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