MIL-PRF-19500 Semiconductor Devices, General Specification ForThis specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process controls to mitigate risk. Mission assurance and standardization of parts are the highest priorities. This specification establishes a heritage program of semiconductor devices the military and space community can rely on to be dependable and available. Detail requirements and characteristics are specified in the specification sheets. Revisions to this specification and specification sheets are structured to assure the interchangeability of devices of the same part type regardless of manufacturing date code or conformance inspection \(CI\) completion date. Four quality levels for encapsulated devices are provided for in this specification, differentiated by the prefixes JAN, JANTX, JANTXV, and JANS. Eight radiation hardness assurance \(RHA\) levels are provided for the JANTXV and JANS quality levels. These are designated by the letters M, D, P, L, R, F, G, and H following the quality level portion of the prefix. Two quality levels for unencapsulated devices are provided for in this specification, differentiated by the prefixes JANHC and JANKC.

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MIL-PRF-19500P

APPENDIX E

E.3.7.2.1 Particle impact noise detector (PIND) test equipment failure or error. If it is determined through an

engineering evaluation and traceable through the manufacturer's quality system, that PIND rejects are the result of

equipment failure or human error, then all devices (passed and rejected) subsequent to the equipment failure or

human error, may be restarted. The devices shall be restarted at the run in which it was determined the equipment

failed or the human error occurred.

E.3.7.3 Standard mixer diodes and holders. The manufacturer of UHF and microwave mixer diodes shall establish

and maintain standard mixer diodes and standard mixer holders for use in qualification and quality conformance

testing of UHF and microwave mixer diodes. These standards shall be calibrated at least once in each successive

12-month period or prior to use if over 12 months, at a laboratory acceptable to the Government.

E.3.8 JANS electrical test data. Unless otherwise specified in the specification sheet, all electrical measurements

performed on devices after screen 8 of table E-IV shall be recorded and traceable to the serial number. This includes

all manufacturing imposed tests.

E.3.8.1 Summary of parts fallout. A summary of the JANS parts fallout during screening tests shall be prepared by

the manufacturer in accordance with the requirements of the qualifying activity

E.3.9 Preservation of lot identity. During all screening, inspection, and marking operations, each lot and sublot

shall be kept segregated, secure, and traceable.

E.4 VERIFICATION

E.4.1 Qualification inspection. Qualification inspection shall be performed at a facility approved by the qualifying

activity and shall be conducted in accordance with the procedures described herein for groups A, B, C, D, and E

inspection and by the qualifying activity. Qualification of a particular device type to a given quality level may be

extended by the qualifying activity to any other quality level provided all the groups A, B, C, D, and E requirements of

the other level have been met and provided that suitable approved screening facilities are available for the other tests

and stress levels. In addition, the requirements of appendix H shall be met. Small lot sampling shall not be used for

qualification inspection. Variables data is required for qualification. Manufacturers shall notify the qualifying activity

when a qualification lot is removed from consideration as a qualification lot. The manufacturer shall notify the

qualifying activity in writing within 35 days that the lot is being removed from consideration.

Group D is required for each inspection lot of RHA types as specified in the specification sheet. Qualification for

RHA shall be for a specific semiconductor die.

An alternate qualification procedure for RHA devices for levels M, L, and D only, are available for devices with

demonstrated RHA. These devices shall be submitted for qualification inspection and conformance inspection, if

process or design changes affecting RHA are made.