MIL-PRF-19500-114 Semiconductor Device, Diode, Silicon, Voltage Regulator, 1N2804B Through 1N2811B, 1N2813B, 1N2814B, 1N2816B, 1N2818B Through 1N2820B, 1N2822B Through 1N2827B, 1N2829B, 1N2831B Through 1N2838B, 1N2840B Through 1N2846B, And Rb Types, 1N4557B Through 1N4562B, And Rb Types, Jan, Jantx, Jantxv, And JansThe specification covers the performance requirements for 50 watt silicon voltage regulator diodes. Forty-two devices, each with standard \(B types\) and reverse \(RB types\) polarity are addressed by this specification. Four levels of product assurance are provided for each device type as specified in MIL┬ûPRF┬û19500.

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MIL�PRF�19500/114H

TABLE II. Groups A, B, and C delta electrical measurements. 1/ 2/

Limits

Step

Inspection

Symbol

Unit

Method

Conditions

Min

Max

ĆVF 3/

Forward voltage

4011

IF = 10 A dc

�50 mV dc

change from

previously

measured value.

The delta electrical measurements for table E�VIa (JANS) of MIL�PRF�19500 shall be as follows:

a. In addition to the measurements specified for subgroup 3, the measurements of step 1 of this table shall

also be taken.

b. In addition to the measurements specified for subgroup 4, the measurements of step 1 of this table shall

also be taken.

c. In addition to the measurements specified for subgroup 5, the measurements of steps 1 of this table shall

also be taken.

2/ The delta electrical measurements for table E�VII of MIL�PRF�19500 shall be as follows:

a. In addition to the measurements specified for subgroup 2, the measurements of step 1 (JANS) of this table

shall also be taken.

b. In addition to the measurements specified for subgroup 3, the measurements of step 1 (JANS) of this table

shall also be taken.

c. In addition to the measurements specified for subgroup 6, the measurements of step 1 of this table shall

also be taken.

3/ Devices which exceed the group A limits for this test shall not be accepted.