MIL-PRF-19500/144R
4.3.2 Power burn-in conditions. Power burn-in conditions are as follows (see 4.5.2): Method 1038 of
MIL-STD-750, condition B. VR = rated VRWM; f = 50 - 60 Hz; IO(min) = IF = IO(PCB). TA = 75°C maximum. The
maximum current density of small die shall be submitted to the qualifying activity for approval. With approval of the
qualifying activity and preparing activity, alternate burn-in criteria (hours, bias conditions, mounting conditions, etc.)
may be used for JANTX and JANTXV quality levels. A justification demonstrating equivalence is required. In
addition, the manufacturing site's burn-in data and performance history will be essential criteria for burn-in
modification approval.
4.3.3 Thermal impedance measurements. The thermal impedance measurements shall be performed in
accordance with method 3101 or 4081 of MIL-STD-750, as applicable, using the guidelines in that method for
determining IH and IM. tMD shall be 70 µs maximum, tH shall be 10 ms maximum. The thermal impedance limit shall
comply with the thermal impedance graphs on figures 6, 7 and 8 (less than or equal to the curve value at the same tH
time) and shall be less than the process determined statistical maximum limit as outlined in method 3101 or 4081 of
MIL-STD-750, as applicable. See group E, subgroup 4 of table II herein.
4.3.4 JAN testing. JAN level product will have temperature cycling and thermal impedance testing performed in
accordance with MIL-PRF-19500, JANTX level screening level requirements. Electrical testing shall be in
accordance with table I, subgroup 2 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of MIL-PRF-19500,
table I herein, and as specified herein. Electrical measurements (end-points) shall be in accordance with table I,
subgroup 2 herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and 4.4.2.1 herein. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2.
4.4.2.1 Group B inspection, table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500. Leaded samples from
the same lot may be used in lieu of `UR' suffix sample for life test.
Subgroup Method
Conditions
0°C to +100°C, 10 cycles.
B2
1056
-55°C to +175°C, 45 cycles, including screening.
B2
1051
IF = 100 mA, axial tensile stress = 8 lbs., TA = +150°C; (not applicable to UR or UB
B2
2005
package).
V(pk) = rated VRWM; f = 50 - 60 Hz; IO = 200 mA dc minimum; adjust TA or IO to obtain a
B3
1027
minimum TJ of +150°C. (See 4.5.2.)
B4
2101
Decap analysis; (Scribe and break not applicable for UB)
TA = +175°C.
B6
1032
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
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