MIL-PRF-19500/225K
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 4
Small-signal short-circuit
3206
80
200
VCE = 5 V dc; IC = 1 mA dc
hfe
forward current transfer ratio
f = 1 KHz
90
270
VCE = 10 V dc; IC = 5 mA dc
hfe
f = 1 KHz.
hfe
Magnitude of small-signal short-
3306
3.5
12
VCE = 10 V dc; IC = 50 mA dc;
circuit forward current
f = 20 MHz
transfer ratio
Small-signal short- circuit input
3201
4
8
ohms
VCB = 10 V dc;
hib
*
impedance
IC = 5 mA dc f = 1 kHz
Small-signal short-circuit input
3216
VCB = 10 V dc;
hob
*
admittance
IC = 5 mA dc f = 1 kHz
µmhos
2N1711, 2N1711S
0.0
1.0
µmhos
2N1890, 2N1890S
0.0
.3
Small-signal open-circuit
3211
VCB = 10 V dc;
hrb
*
reverse voltage transfer ratio
IC = 5 mA dc f = 1 kHz
-4
µmhos
2N1711, 2N1711S
5x10
µmhos
2N1890, 2N1890S
-4
1.5x10
Open circuit output capacitance
VCB = 10 V dc; IE = 0 mA dc
Cobo
100 kHz ≤ f ≤ 1 mHz
2N1711, 2N1711S
8
25
pF
2N1890, 2N1890S
5
15
pF
Pulse response
3251
Test condition A, except test circuit
30
ns
ton + toff
and pulse requirements.
See figure 6 herein.
Subgroup 5, 6, and 7
Not applicable
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence of
tests.A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be
rerun upon submission.
3/ Separate samples may be used.
4/ Not required for laser marked devices.
5/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.
6/ This test required for the following end-point measurement only:
*
Group B, subgroups 3, 4, and 5 (JANTX and JANTXV).
*
Group B, step 1.
*
Group C, subgroups 2 and 6.
*
Group E, subgroups 1 and 2.
9
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