MIL-PRF-19500/270J
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 4 - Continued
3
25
Common emitter small-
3306
VCE = 10 V dc; IC = 50 mA dc;
|hfe|
signal short-circuit forward-
f = 20 MHz
current transfer ratio
Ω
20
30
Small-signal short-circuit
3201
VCB = 5 V dc; IC = 1 mA dc;
hib
input impedance
f = 1 kHz
Ω
1,000
4,000
Small-signal short circuit
3201
VCE = 5 V dc; IC = 1 mA dc;
hie
input impedance
f = 1 kHz
µmhos
Small-signal open-circuit
3216
0
16
VCE = 5 V dc; IC = 1 mA dc;
hoe
output admittance
f = 1 kHz
15
pF
Output capacitance (input
3236
VCB = 10 V dc; IE = 0;
Cobo
100 kHz ≤ f ≤ 1 MHz
open circuited)
Input capacitance (output
3240
85
pF
VEB = 0.5 V dc; IE = 0;
Cibo
100 kHz ≤ f ≤ 1 MHz
open circuited)
VCE = 10 V dc; IC = 300 µA dc;
F1
8
dB
Noise figure
3246
Rg = 510 Ω; f = 1 kHz (see 4.5.7)
VCE = 10 V dc; IC = 300 µA dc;
F2
8
dB
Noise figure
3246
Rg = 1 kΩ; f = 10 kHz (see 4.5.7)
Collector to collector
Test condition (see 4.5.3)
100
nA dc
I(collector 1 to
leakage
V(collector 1 to collector 2) = 100 V dc
collector2)
1/ For sampling plan, see MIL-PRF-19500.
2/ For resubmission of failed test in subgroup 1, double the sample size of the failed test or sequence of tests. A
failure in subgroup 1 of table I shall not require retest of the entire subgroup. Only the failed test shall be
rerun upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ The larger number will be placed in the denominator.
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