MIL-PRF-19500-270 Semiconductor Device, Unitized, Dual-Transistor, Npn, Silicon, Types 2N2060 And 2N2060L, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for two electrically isolated, matched NPN, silicon transistors as one dual unit. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/270J

4.3.2 Thermal impedance (ZθJX measurements). The ZθJX measurements shall be performed in accordance with

method 3131 of MIL-STD-750.

a. IM measurement current ---------------5 mA.

b. IH forward heating current ------------200 mA (min).

c. tH heating time --------------------------25 - 30 ms.

d. tmd measurement delay time --------60 �s max.

e. VCE collector-emitter voltage -------10 V dc minimum

The maximum limit for ZθJX under these test conditions are ZθJX (max) = 72�C/W.

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as

specified herein. If alternate screening is being performed in accordance with MIL-PRF-19500, a sample of screened

devices shall be submitted to and pass the requirements of group A1 and A2 inspection only (table VIb, group B,

subgroup 1 is not required to be performed again if group B has already been satisfied in accordance with 4.4.2).

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I

herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for

subgroup testing in table VIa (JANS) of MIL-PRF-19500 and 4.4.2.1. Electrical measurements (end-points) and delta

requirements shall be in accordance with table I, subgroup 2 and 4.5.9 herein. See 4.4.2.2 for JAN, JANTX, and

JANTXV group B testing. Electrical measurements (end-points) and delta requirements for JAN, JANTX, and

JANTXV shall be after each step in 4.4.2.2 and shall be in accordance with table I, subgroup 2 and 4.5.9 herein.

4.4.2.1 Group B inspection, table VIa (JANS) of MIL-PRF-19500.

Subgroup Method

Condition

1037

VCB = 10 V dc.

VCB = 10 V dc; PD ≥ 100 percent of maximum rated PT (see 1.3). (NOTE: If a failure

1027

occurs, resubmission shall be at the test conditions of the original sample.)

Option 1: 96 hours minimum sample size in accordance with MIL-PRF-19500, table VIa,

adjust TA or PD to achieve TJ = +275�C minimum.

Option 2: 216 hours minimum, sample size = 45, c = 0; adjust TA or PD to achieve a

TJ = +225�C minimum.