MIL-PRF-19500/287G
* TABLE I. Group A inspection - Continued.
Inspection 1/
Symbol
Unit
MIL-STD-750
Limits
Method
Conditions
Min
Max
Subgroup 4 - Continued
IC = 300 mA dc; IB1 = IB2 = 30
Saturated turn-off time
3251
25
ns
toff
mA dc; VCC = 15 V dc;
(see figure 2); test condition A
18
ns
Storage time
3251
Test condition A; IC = 10 mA dc;
ts
IB1 = IB2 = -10 mA dc (see figure 3)
Subgroups 5, 6, and 7
Not applicable
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed test subgroup of table I, double the sample size of the failed test or sequence of
tests. A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall
be rerun upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.
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